Multi-beam scanning electron microscope, MultiSEM 706, ZEISS
Repair, replacement of parts, 24/7 technical support
Verification in real production conditions
Setting up and checking the functionality of the equipment
Training operators to work with the equipment and providing practical demonstrations of its functionality.
ZEISS MultiSEM 706 is a multi-beam scanning electron microscope designed for ultra-fast automated nanoscale imaging. Unlike conventional SEM systems, MultiSEM uses 91 electron beams operating in parallel, enabling exceptionally high-speed acquisition of large sample areas and volumes.
The system is intended for applications where it is important not only to resolve fine structures, but also to preserve the macroscopic context of the sample. MultiSEM 706 combines high throughput, automated acquisition workflows, stable continuous 24/7 operation, and the ability to generate large datasets for further analysis and 3D reconstruction.
Key Features
- Multi-beam SEM platform with 91 parallel electron beams
- Ultra-fast image acquisition at nanometer resolution
- Automated imaging of large areas and serial sections
- Imaging of large samples without losing fine detail
- Stable continuous 24/7 operation
Technologies
- Multi-beam technology: 91 electron beams with parallel multi-channel detection for a dramatic increase in imaging speed
- Parallel acquisition: simultaneous generation of multiple sub-images with automatic merging into one final image
- ZEN for MultiSEM: software environment for microscope control, workflow automation, and handling of large data volumes
- Automated Section Detection: automatic identification of serial sections for fast workflow setup
- Intelligent Retake Manager: data completeness control and selective reacquisition of missing or insufficient regions
Applications
- Connectomics and large-scale brain mapping
- Serial sections and 3D reconstruction of tissue ultrastructure
- Microelectronics, integrated circuits, and reverse engineering
- Battery research, materials science, and polished geological samples
- High-throughput imaging of large areas for statistically relevant analysis
Advantages
- Extremely high speed: a fundamentally new level of productivity compared with single-beam SEM systems
- Scale combined with detail: large sample areas with nanometer-scale resolution
- Automation: reduced manual effort in large serial imaging projects
- Ideal for large datasets: optimized for high-throughput and long-duration projects
- Infrastructure-grade solution: designed for laboratories and centers where speed, scale, and reproducibility are critical
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