Universal Scanning Electron Microscope, EVO 10, ZEISS

ZEISS EVO is a family of versatile scanning electron microscopes (SEM) based on a modular platform designed for a wide range of research and industrial applications. The system combines reliable imaging performance, flexible configuration, and intuitive operation.

EVO is intended for users who need a dependable tool for everyday work — from routine quality control to applied research in materials science, industry, and natural sciences. With multiple vacuum modes, the system enables efficient imaging of conductive and non-conductive, hydrated, or contaminated samples with minimal preparation.

Key Features

• Reliable SEM imaging with nanometer-scale resolution
• Modular platform configurable for specific applications
• Efficient imaging of non-conductive samples
• Support for automated imaging and analysis workflows
• User-friendly interface for operators of different experience levels

Technologies

• Variable Pressure (VP): imaging non-conductive samples without coating
• Extended Pressure (ESEM): imaging hydrated and biological samples in near-natural conditions
• LaB6 electron source: increased beam brightness and improved contrast
• Beam Deceleration: enhanced surface sensitivity and reduced beam impact on the sample
• EDS/EBSD: elemental and crystallographic analysis

Applications

• Quality control and industrial inspection
• Materials and metallurgy analysis
• Semiconductor and electronics research
• Geology and raw materials analysis
• Life sciences and natural sciences research

Advantages

• Versatility: one platform for multiple applications and sample types
• Ease of use: suitable for both experienced users and beginners
• Flexibility: wide range of configurations and add-ons
• Real-world sample capability: minimal sample preparation required