Field Emission Scanning Electron Microscope, Sigma 360, ZEISS

ZEISS Sigma is a family of field emission scanning electron microscopes (FE-SEM) designed for high-quality imaging and advanced analysis. The system combines high resolution, efficient low-voltage operation, and flexible analytical capabilities for research and industrial applications.

Sigma is intended for users who require not only SEM imaging but also precise sample characterization at the micro- and nanoscale. With ZEISS Gemini 1 electron optics, a wide range of detectors, support for Variable Pressure and NanoVP lite modes, the system delivers reliable results even when working with delicate, non-conductive, or complex samples.

Key Features

• Field emission FE-SEM platform for high-resolution imaging and analysis
• High resolution at low accelerating voltages, including 1 kV and below
• Advanced capabilities for elemental, crystallographic, and morphological analysis
• Efficient imaging of non-conductive samples without mandatory coating
• Support for automated workflows, AI-based analysis, and multimodal microscopy

Technologies

• ZEISS Gemini 1 optics: high-resolution electron optics with small probe size and efficient Inlens detection
• Low-kV imaging: enhanced detail and contrast at low accelerating voltages for surface-sensitive imaging
• NanoVP lite: advanced variable pressure mode for imaging and analysis of non-conductive samples with improved signal-to-noise ratio
• Flexible Detection: wide range of detectors for topographical, compositional, and structural information
• ZEN core / RISE / SmartPI / Mineralogic: software and analytical ecosystem for correlative microscopy, Raman imaging, particle analysis, and automated mineralogy

Applications

• Materials science and nanomaterials
• Energy materials, batteries, catalysts, polymers
• Life sciences research
• Geology, mineralogy, and natural resource analysis
• Industrial microscopy, failure analysis, quality control, and particle analysis

Advantages

• High-end FE-SEM class: transition from routine imaging to nanoscale analytics
• Excellent low-kV performance: more surface information with reduced sample damage
• Analytical flexibility: integration of EDS, EBSD, WDS, Raman, and other techniques
• Handling complex samples: efficient imaging of non-conductive and sensitive materials
• Scalability: Sigma 360 and Sigma 560 configurations allow adaptation to specific laboratory needs