Wave dispersion x-ray fluorescence spectrometer, MXF-2400, Shimadzu

Multichannel wave dispersion spectrometer with a scanning channel

The device is designed for simultaneous analysis of up to 36 main elements (fixed channels) and sequential determination of up to 48 elements using a scanning channel when solving quality control or research tasks. High analytical accuracy of the spectrometer is ensured even when measuring trace concentrations of elements (at the level of several ppm).

Features

Due to the original design of the converging spectrometric system, the focus does not diverge and becomes extremely small at the secondary slit, so that the reflected X-ray intensity is extremely high with good resolution compared to other systems.
Excellent measurement reproducibility was achieved for light elements (such as Be, B, C, Al and Si).
The calibration curve can cover more than 3000000 cps (from 0% to 100%), while high accuracy is ensured even in the high concentration region where the X-ray intensity is very high.
Analytical information can be customized for each individual sample and each individual item. In addition, you can use the function of automatic sensitivity correction (counter loss correction).
Simultaneous determination of up to 36 main and impurity elements. A scanning monochromator allows for automatic qualitative analysis and can also be used for quantitative measurements.
Standard and control samples can be safely placed on the autosampler (8 positions) for long periods of time, as the device is supplied with a dust cover.
A reliable pendulum-type sample introduction system performs sample replacement within 5 seconds in one movement. This simple design minimizes downtime and ensures stable operation even under high-performance operations.