Wave dispersion x-ray fluorescence spectrometer, XRF-1800, Shimadzu

Sequential wave dispersion X-ray fluorescence spectrometer

The highly sensitive device XRF-1800, having excellent sensitivity to light elements and good resolution of lines of rare earth metals, is an ideal tool for the analysis of heterogeneous objects of various origins.

Features

The increased sensitivity of the new optical system is achieved due to the use of a 4 kW X-ray tube with a thin window, a system for changing filters (5 types for primary radiation), the ability to select the depth of vacuum and the speed of blowing gases (air, helium, nitrogen), as well as reducing the distance from the tube to the sample and the aperture of the diaphragm.
Mapping the distribution of elements with a step of 250 μm allows qualitative and quantitative analysis of heterogeneous samples in the range from Be to U, and the ultra-fast scanning function (300 ⁰/min) significantly reduces the measurement speed (2.5 min).
Emissions of the first and higher orders are measured simultaneously.
Determination of the thickness and elemental composition of high molecular weight films and inorganic coatings by the method of fundamental parameters using Compton scattering lines.
The unique and reliable sample feeding system minimizes downtime and ensures stable operation even under high-performance operations.