X-ray diffractometer, MAXIMA X XRD-7000, Shimadzu
Available on back-order
Repair, replacement of parts, 24/7 technical support
Verification in real production conditions
Setting up and checking the functionality of the equipment
Training operators to work with the equipment and providing practical demonstrations of its functionality.
X-ray diffractometer
The device with a high-precision vertical θ-θ goniometer is designed for the analysis of various samples, including especially large ones (up to 350 mm in diameter and 190 mm thick). The structural solution used in the diffractometer allows automatic stress mapping of the entire sample with a diameter of up to 350 mm. Any point on the sample can be used for measurement. A set of CCD cameras allows you to confirm the measurement position on the screen.
Features
A polycapillary optics system that provides a high-intensity parallel X-ray beam and fundamentally improves the signal-to-noise ratio.
Anti-monochromator for background reduction.
Autonomous water cooling system
Precise determination of lattice parameters, determination of residual austenite, calculation of degree of crystallinity, determination of crystallite sizes, stress and texture analysis, Rietveld software.
Qualitative and quantitative analysis using PDF-2 and PDF-4 databases.
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